Digital light microscopy
The digital microscope offers an overlay of images from adjacent planes of focus. The final image appears like a photo taken with an optic that offers an extended depth of focus. The steps between the planes of focus are precisely known and enable to calculate altitudes in 3D-images.
The overlay technique enables a simultaneous inspection of details that exceed the depth of focus, e.g. at the bottom of the object. The image shows a missaligned winding off-set at an extended depth of field.
The photo depicts the contact side of a capacitor. The housing and the lead have been removed. The depth of the grove underneath the position of the lead is of interest.
Here the lead was imprinted into the winding off-set which finally caused a malfunction of the device.